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Abstract The ability to probe and control matter at the picometer scale is essential for advancing quantum and energy technologies. Scanning transmission electron microscopy offers powerful capabilities for materials analysis and modification, but sample damage, drift, and scan distortions hinder single atom analysis and deterministic manipulation. Materials analysis and modification via electron–solid interactions can be transformed by precise delivery of electrons to a specified atomic location, maintaining the beam position despite drift, and minimizing collateral dose. Here a fast, low‐dose, sub‐20‐pm precision electron beam positioning technique is developed, “atomic lock‐on,” (ALO), which offers the ability to position the beam on a specific atomic columnwithoutpreviously irradiating that column. This technique is used to lock onto a single selected atomic location to repeatedly measure its weak electron energy loss signal despite sample drift. Moreover, electron beam‐matter interactions in single atomic events are measured with time resolution. This enables observation of single‐atom dynamics, such as atomic bistability, revealing partially bonded atomic configurations and recapture phenomena. This opens prospects for using electron microscopy for high‐precision measurements and deterministic control of matter for quantum technologies.